High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction-Reference-Cited by-同舟云学术

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High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Published:2023 Issue: Volume:22 Page:273-279
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Noom Jacques¹^ORCID,Smith Carlas¹^ORCID,Verbiest Gerard J.²^ORCID,Katan Allard J.³^ORCID,Soloviev Oleg⁴^ORCID,Verhaegen Michel¹^ORCID

Affiliation:

1. Delft Center for Systems and Control (DCSC), Delft University of Technology, Delft, The Netherlands

2. Department of Precision and Microsystems Engineering, Delft University of Technology, Delft, The Netherlands

3. Department of Bionanoscience, Kavli Institute of Nanoscience Delft, Delft University of Technology, Delft, The Netherlands

4. DCSC, Delft University of Technology, Delft, The Netherlands

Funder

ECSEL Joint Undertaking

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx7/7729/10016255/10147309.pdf?arnumber=10147309

Reference26 articles.

1. High speed atomic force microscopy enabled by a sample profile estimator

2. Control techniques for high-speed dynamic mode imaging in atomic force microscopes

3. Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy With a Regularized Kalman Filter

4. Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy

5. Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method

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