Thermal Regulator for IC Temperature Characterization Using a Microprobe Station

Author:

Baderna D.,Cabrini A.,Torelli G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. Measurement of Thermal Diffusivity of Thin Film in Thickness Direction Using an Ordinary Dielectric Film as the Sensor;IEEE Transactions on Instrumentation and Measurement;2022

3. Productivity Improvement on Functional Test of Integrated Circuits Device Under High Temperature Condition;Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015);2019

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