1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Path Unselection for Path Delay Fault Test Generation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
4. Selecting Path Delay Faults Through the Largest Subcircuits of Uncovered Lines;2022 IEEE 31st Asian Test Symposium (ATS);2022-11