Properties of Microstrip Line on Si-SiO/sub 2/ System-Reference-Cited by-同舟云学术

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Properties of Microstrip Line on Si-SiO/sub 2/ System

Published:1971-11 Issue:11 Volume:19 Page:869-881
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Hasegawa H.,Furukawa M.,Yanai H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx6/22/24974/01127658.pdf?arnumber=1127658

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