Analysis of an open-ended coaxial probe with lift-off for nondestructive testing-Reference-Cited by-同舟云学术

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Analysis of an open-ended coaxial probe with lift-off for nondestructive testing

Published:1994 Issue:5 Volume:43 Page:711-718
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Baker-Jarvis J.,Janezic M.D.,Domich P.D.,Geyer R.G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx1/19/7775/00328897.pdf?arnumber=328897

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