In Situ Measurement of Absorbing Properties of Materials Based on Near-Field Reflection Method-Reference-Cited by-同舟云学术

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In Situ Measurement of Absorbing Properties of Materials Based on Near-Field Reflection Method

Published:2023-04-01 Issue:7 Volume:23 Page:6822-6831
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Zhang Yunpeng¹^ORCID,Xie Chunmao¹,Zhang Jing²,Chen Xuefei³,Feng Kai³,Li En¹^ORCID

Affiliation:

1. School of Electronic Science and Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China

2. School of Physical Science and Technology, Southwest Jiaotong University, Chengdu, China

3. Chengdu Enchi Microwave Technology Company Ltd., Chengdu, China

Funder

National Natural Science Foundation of China

China Postdoctoral Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/10089784/10056848.pdf?arnumber=10056848

Reference27 articles.

1. Microwave material measurements without cables;schultz;Microw J,2017

2. Compact Dielectric Constant Characterization of Low-loss Thin Dielectric Slabs with Microwave Reflection Measurement

3. Reflectivity Study of Microwave Blackbody Target

4. Design Criteria for Near-Field-Focused Planar Arrays

5. A New Permittivity Measurement Method for Walls in Indoor Scenes

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1. A Valid Evaluation Method for Electromagnetic Shielding Efficiency of Metallic Mesh Based on Free-Space Reflection Measurement;IEEE Transactions on Instrumentation and Measurement;2024

2. Trapped Multimodal Resonance in Magnetic Field Enhancement and Sensitive THz Plasmon Sensor for Toxic Materials Accusation;IEEE Sensors Journal;2023-07-01

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