Author:
Ishii Takatoshi,Songmuang Pokpong,Ueno Maomi
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computer Science Applications,General Engineering,Education
Cited by
20 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automated Parallel Test Forms Assembly using Zero-suppressed Binary Decision Diagrams;IEEE Access;2023
2. Item Difficulty Constrained Uniform Adaptive Testing;Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky;2023
3. Automated Test Assmbly using Zero-suppressed Binary Decision Diagrams;Transactions of the Japanese Society for Artificial Intelligence;2022-09-01
4. Hybrid Maximum Clique Algorithm Using Parallel Integer Programming for Uniform Test Assembly;IEEE Transactions on Learning Technologies;2022-04-01
5. Two-Stage Uniform Adaptive Testing to Balance Measurement Accuracy and Item Exposure;Lecture Notes in Computer Science;2022