Author:
Ueno Maomi,Miyazawa Yoshimitsu
Publisher
Springer International Publishing
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Automated Parallel Test Forms Assembly using Zero-suppressed Binary Decision Diagrams;IEEE Access;2023
2. Item Difficulty Constrained Uniform Adaptive Testing;Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky;2023
3. Balancing Test Accuracy and Security in Computerized Adaptive Testing;Lecture Notes in Computer Science;2023