Extending RIS Life Span for Reliable Communication Under Hardware Ageing Effects-Reference-Cited by-同舟云学术

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Extending RIS Life Span for Reliable Communication Under Hardware Ageing Effects

Published:2024 Issue: Volume:5 Page:3395-3409
ISSN:2644-125X
Container-title:IEEE Open Journal of the Communications Society
language:
Short-container-title:IEEE Open J. Commun. Soc.

Author:

Mondal Atiquzzaman¹^ORCID,Ghosh Shyamal²,Singh Keshav³^ORCID,Biswas Sudip¹^ORCID,Duong Trung Q.⁴^ORCID

Affiliation:

1. Department of Electrical Communication Engineering, Indian Institute of Information Technology Guwahati, Guwahati, India

2. Department of Data Science, Indian Institute of Science Education and Research Thiruvananthapuram, Thiruvananthapuram, India

3. Institute of Communications Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan

4. Faculty of Engineering and Applied Science, Memorial University, St. John’s, NL, Canada

Funder

Science and Engineering Research Board (SERB), India

National Science and Technology Council of Taiwan

Sixth Generation Communication and Sensing Research Center funded by the Higher Education SPROUT Project, the Ministry of Education of Taiwan

Canada Excellence Research Chair (CERC) Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/8782661/10362961/10540054.pdf?arnumber=10540054

Reference38 articles.

1. Wideband Gain Enhancement of High-Isolation and Quasi-Omnidirectional Metamaterial MIMO Antenna for Vehicular Radar

2. Broadband Characterization of Silicate Materials for Potential 5G/6G Applications

3. Towards Smart and Reconfigurable Environment: Intelligent Reflecting Surface Aided Wireless Network

4. Holographic MIMO Surfaces for 6G Wireless Networks: Opportunities, Challenges, and Trends

5. 6G and Beyond: The Future of Wireless Communications Systems

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