Broadband Characterization of Silicate Materials for Potential 5G/6G Applications
Author:
Affiliation:
1. Materials Research Institute, Penn State University, University Park, PA, USA
2. Department of Electronic Systems, APMS Section, Aalborg University, Aalborg East, Denmark
Funder
National Science Foundation through the Center for Dielectrics and Piezoelectrics
VILLUM FONDEN
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
https://ieeexplore.ieee.org/ielam/19/10012124/10068249-aam.pdf
Reference43 articles.
1. Low-Loss Glass Substrates Formulated with a Variety of Dielectric Characteristics for Millimeter-Wave Applications
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3. Special glass for packaging of high frequency electronics
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5. Dielectric polarizability of alkali and alkaline-earth modified silicate glasses at microwave frequency
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