High-Resolution Terahertz Imaging of Debonding Defects in Thermal Barrier Coatings Using an Optimal Wavelet Transform-Reference-Cited by-同舟云学术

High-Resolution Terahertz Imaging of Debonding Defects in Thermal Barrier Coatings Using an Optimal Wavelet Transform

Published:2023 Issue: Volume:72 Page:1-11
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Sun Fengshan¹^ORCID,Fan Mengbao¹^ORCID,Cao Binghua²^ORCID,Ye Bo³^ORCID,Liu Lin⁴^ORCID

Affiliation:

1. School of Mechatronic Engineering, China University of Mining and Technology, Xuzhou, China

2. School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, China

3. Faculty of Information Engineering and Automation, Kunming University of Science and Technology, Kunming, China

4. Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing, China

Funder

National Natural Science Foundation of China

Priority Academic Program Development of Jiangsu Higher Education Institutions

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10177796.pdf?arnumber=10177796

Reference39 articles.

1. Terahertz nondestructive imaging for foreign object detection in glass fibre-reinforced polymer composite panels

2. Fractal geometry of wavelet decomposition in mechanical signature analysis

3. A Terahertz Fast Imaging Method for Debonding Defects of Thermal Barrier Coatings Based on Dual-Channel Convolutional Neural Network

4. WaveletKernelNet: An Interpretable Deep Neural Network for Industrial Intelligent Diagnosis

5. Defect identification of layered adhesive structures based on dynamic time warping and simulation analysis;zhang;Infrared Physics & Technology,2021

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