Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX-Reference-Cited by-同舟云学术

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Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Published:1995-12 Issue:6 Volume:42 Page:1964-1974
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Adolphsen J.,Barth J.L.,Stassinopoulos E.G.,Gruner T.,Wennersten M.,LaBel K.A.,Seidleck C.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/10517/00489241.pdf?arnumber=489241

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. References;Single Event Effects in Aerospace;2012-03-12

3. Temporal variations of strength and location of the South Atlantic Anomaly as measured by RXTE;Earth and Planetary Science Letters;2009-05-15

4. Radiation Interactions;The Space Environment and Its Effects on Space Systems;2008-01

5. The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft;Cosmic Research;2005-11

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