The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft
Author:
Publisher
Springer Science and Business Media LLC
Subject
Space and Planetary Science,Astronomy and Astrophysics,Aerospace Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10604-005-0066-9.pdf
Reference55 articles.
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2. Wilkinson, D.C., Daughtridge, S.C., Stone, J.L., et al., TDRS-1 Single Event Upsets and Effects of the Space Environment, IEEE Trans. Nucl. Sci., 1991, vol. 38, no.6, pp. 1708–1714.
3. Seidleck, C.M., LaBel, K.A., Moran, A.K., et al., Single Event Effect Flight Data Analysis of Multiple NASA Spacecraft and Experiments; Implications to Spacecraft Electrical Designs, Proc. of RADECS-95 (Sept. 18–22, 1995, Arcachon, France), pp. 581–588.
4. Shoga, M., Adams, P., Chenette, D.L., et al., Verification of Single Event Upset Rate Estimation Methods with On-Orbit Observations, IEEE Trans. Nucl. Sci., 1987, vol. 34, no.6, pp. 1256–1261.
5. Campbell, A., McDonald, P., and Ray, K., Single Event Upset Rates in Space, IEEE Trans. Nucl. Sci., 1992, vol. 39, no.6, pp. 1828–1835.
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