Measurement of Internal Electric Field in GaN-Based Light-Emitting Diodes-Reference-Cited by-同舟云学术

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Measurement of Internal Electric Field in GaN-Based Light-Emitting Diodes

Published:2012-04 Issue:4 Volume:48 Page:500-506
ISSN:0018-9197
Container-title:IEEE Journal of Quantum Electronics
language:
Short-container-title:IEEE J. Quantum Electron.

Author:

Su-Ik Park ,Jong-Ik Lee ,Dong-Hyun Jang ,Hyun-Sung Kim ,Dong-Soo Shin ,Han-Youl Ryu ,Jong-In Shim

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx5/3/6151637/06145600.pdf?arnumber=6145600

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