A GRU-Based Method of IGBT Module Degradation Prediction Under Changing Working Conditions
Author:
Affiliation:
1. Naval University of Engineering,National Key Laboratory of Science and Technology on Vessel Integrated Power System,Wuhan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9941505/9941739/09941898.pdf?arnumber=9941898
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4. Model for Power Cycling lifetime of IGBT Modules - various factors influencing lifetime;bayerer;the Second International Conference on Systems Integration,2008
5. Probabilistic Monte-Carlo Method for Modelling and Prediction of Electronics Component Life
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1. Research on IGBT aging prediction method based on adaptive VMD decomposition and GRU-AT model;Energy Reports;2023-09
2. Design of IGBT Parameter Prediction Algorithm Based on LSTM Network;2023 6th International Conference on Electronics Technology (ICET);2023-05-12
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