Author:
David R.,Fuentes A.,Courtois B.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
24 articles.
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1. Predictive Techniques for Projecting Test Data Volume Compression;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-09
2. Testing Embedded Memories: A Survey;Mathematical and Engineering Methods in Computer Science;2013
3. The state-of-art and future trends in testing embedded memories;Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004.;2004
4. Efficient march test for 3-coupling faults in random access memories;Microprocessors and Microsystems;2001-03
5. A scheme for multiple on-chip signature checking for embedded SRAMS;Journal of Systems Architecture;2000-01