1. What Would Interactive Testing With 1687 Look Like?;2024 IEEE European Test Symposium (ETS);2024-05-20
2. IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
3. Testability Considerations for Custom Processing-In-Memory Cores;2024 12th International Electrical Engineering Congress (iEECON);2024-03-06
4. Path Margin Monitor for Silicon Lifecycle;2023 IEEE Women in Technology Conference (WINTECHCON);2023-09-21
5. Optimal Pattern Retargeting in IEEE 1687 Networks: A SAT-based Upper-Bound Computation;ACM Transactions on Design Automation of Electronic Systems;2023-05-17