Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode-Reference-Cited by-同舟云学术

Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode

Published:2023-04 Issue:2 Volume:11 Page:1754-1766
ISSN:2168-6777
Container-title:IEEE Journal of Emerging and Selected Topics in Power Electronics
language:
Short-container-title:IEEE J. Emerg. Sel. Topics Power Electron.

Author:

Zhu Ankang¹^ORCID,Ye Shuoyu¹,Kang Jianlong²,Xin Zhen²^ORCID,Luo Haoze³^ORCID,Iannuzzo Francesco⁴^ORCID,Li Wuhua¹^ORCID,He Xiangning¹^ORCID

Affiliation:

1. College of Electrical Engineering, Zhejiang University, Hangzhou, China

2. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China

3. College of Electrical Engineering and the ZJU-Hangzhou Global Scientific and Technological Innovation Center, Zhejiang University, Hangzhou, China

4. Department of Energy Technology, Aalborg University, Aalborg, Denmark

Funder

National Nature Science Foundations of China

“Pioneer” and “Leading Goose” Research and Development Program of Zhejiang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology

Link

Reference29 articles.