Ring Oscillator Based Test Structure for NBTI Analysis
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4252392/4252393/04252402.pdf?arnumber=4252402
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Single Ring-Oscillator-Based Test Structure for Timing Characterization of Dynamic Circuit;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-05
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4. A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS;IEEE Transactions on Circuits and Systems I: Regular Papers;2016-10
5. Lifetime Reliability Enhancement of Microprocessors;ACM Computing Surveys;2015-09-29
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