On the validity of bisection-based thru-only de-embedding
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5462931/5466808/05466857.pdf?arnumber=5466857
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Modified Bisection Thru-Only Deembedding Algorithm for Long Test Fixtures;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15
2. Characterization of Transmission Lines on Lossy or Dispersive Substrates With a Complete Model of a Series Resistor for Impedance Standard of Scattering Parameter Measurements;IEEE Transactions on Instrumentation and Measurement;2023
3. Taper Transmission Line Based Measurement—A Thru-Only De-Embedding Approach;IEEE Transactions on Microwave Theory and Techniques;2022-09
4. Modeling and Verificaion of Millimeter-Wave nMOSFET up to 50 GHz in 180 nm CMOS Technology;2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS);2022-03-21
5. Impedance Corrected De-Embedding;IEEE Electromagnetic Compatibility Magazine;2022
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