Impedance Corrected De-Embedding-Reference-Cited by-同舟云学术

Impedance Corrected De-Embedding

Author:

Ellison Jason J.¹,Agili Sedig S.²

Affiliation:

1. Amphenol,Etters,PA,17019

2. Penn State University,Middletown,PA,USA,17057

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Instrumentation,Signal Processing,Software

Link

Reference19 articles.

1. A deembedding technique for interconnects;song;Proc IEEE Topical Meeting on Electrical Performance of Electronic Packaging,0

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fixture De-Embedding Challenges for Short 2xThru Structure;2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS);2023-12-12

2. An Impedance-Corrected 2x-Thru Calibration;IEEE Microwave and Wireless Technology Letters;2023-12

3. Fixture Mismatch Correction for Wideband Measurements;2023 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium);2023-07-23

4. Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03