Split-CV for pseudo-MOSFET characterization: Experimental setups and associated parameter extraction methods
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/6831033/6841455/06841461.pdf?arnumber=6841461
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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