In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization-Reference-Cited by-同舟云学术

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In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization

Published:2009-03 Issue: Volume: Page:
ISSN:
Container-title:2009 IEEE International Conference on Microelectronic Test Structures
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Author:

Tagro Y.,Gloria D.,Boret S.,Morandini Y.,Dambrine G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4811893/4814590/04814637.pdf?arnumber=4814637

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Wideband mm-Wave Integrated Passive Tuners for Accurate Characterization of (Bi)CMOS Technologies;2022 99th ARFTG Microwave Measurement Conference (ARFTG);2022-06-24

2. Wideband two‐port with programmable scattering parameters;IET Microwaves, Antennas & Propagation;2019-08-22

3. Millimeter-Wave Characterization of Silicon Devices under Small-Signal Regime;Microwave De-embedding;2014

4. SiGe HBT noise parameters extraction using in-situ silicon integrated tuner in MMW range 60–110GHz;2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting;2009-10

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