Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits-Reference-Cited by-同舟云学术

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Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits

Published: Issue: Volume: Page:
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Container-title:Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.
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Author:

Hess C.,Stine B.E.,Weiland L.H.,Sawada K.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8488/26758/01193195.pdf?arnumber=1193195

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors;2023 IEEE International Test Conference (ITC);2023-10-07

2. Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks;2022 IEEE International Test Conference (ITC);2022-09

3. Diagnosing Transition Delay Faults under Scan-Based Logic Array;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08

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