Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results-Reference-Cited by-同舟云学术

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Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results

Published:2016-04 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE 34th VLSI Test Symposium (VTS)
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Author:

Anghel Lorena,Benhassain A.,Sivadasan A.,Cacho F.,Huard V.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7469602/7477250/07477316.pdf?arnumber=7477316

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test Aspects of System Health State Monitoring;2023 IEEE 24th Latin American Test Symposium (LATS);2023-03-21

2. Activity-aware prediction of Critical Paths Aging in FDSOI technologies;Microelectronics Reliability;2021-09

3. Design-Time Exploration for Process, Environment and Aging Compensation techniques for Low Power Reliable-Aware Design;IEEE Transactions on Emerging Topics in Computing;2021

4. On-Chip Ageing Monitoring and System Adaptation;Ageing of Integrated Circuits;2019-10-01

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