Activity-aware prediction of Critical Paths Aging in FDSOI technologies

Author:

Kannan Kalpana Senthamarai,Portolan Michele,Anghel Lorena

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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