Author:
Kannan Kalpana Senthamarai,Portolan Michele,Anghel Lorena
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Adaptive Wearout Management with in-situ aging monitors;Huard,2014
2. Power 7 : IBM's next generation power microprocessor;Taylor,2012
3. L. Lai V. Chandra R. Aitken P. Gupta , “SlackProbe : a low overhead in situ on-line timing slack monitoring methodology,” 2013 Des. Autom. Test Eur. Conf. Exhib., pp. 282–287.
4. Adaptive voltage scaling by in-situ delay monitoring for an image processing circuit;Wirnshofer,2012
5. Run-time aging prediction though machine-learning;Senthamaraikannan,2018
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects;Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD;2024-09-09
2. AI-assisted Design for Reliability: Review and Perspectives;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07
3. Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-09
4. Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03