An Information Theoretic Approach to Digital Fault Testing-Reference-Cited by-同舟云学术

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An Information Theoretic Approach to Digital Fault Testing

Published:1981-08 Issue:8 Volume:C-30 Page:582-587
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Agrawal

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx5/12/35206/01675843.pdf?arnumber=1675843

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Secuirty Metrics for Logic Circuits;2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2022-06-27

2. Reversible stochastic computing in ratioed, unsigned extended and signed extended stochastic logic formats;Microelectronics Journal;2019-08

3. Design of a fault-tolerant reversible control unit in molecular quantum-dot cellular automata;International Journal of Quantum Information;2018-02

4. Information Measures in Nanodimensions;Logic Design of NanoICS;2017-12-19

5. Efficient Techniques for Fault Detection and Correction of Reversible Circuits;Journal of Electronic Testing;2017-08-09

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