Author:
Babu Hafiz Md. Hasan,Mia Md. Solaiman,Biswas Ashis Kumer
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference41 articles.
1. Agarwal VD (1981) An information theoretic approach to digital fault testing. IEEE Trans Con Comp, 582–587
2. Allen JS, Biamonte JD, Perkowsky MA (2005) ATPG for Reversible Circuits using Technology Related Fault Models. Proc 7th Int Symp on Representations and Methodology of Future Computing Technologies, RM2005, Tokyo, Japan 2005, 1-8
3. Babu HMH, Islam MR, Chowdhury SMA, Chowdhury AR (2004) Synthesis of Full-Adder Circuit Using Reversible Logic. Proc 17th Int Conf VLSI Des, 757–760
4. Barshan M, Bahramnejad S, Kalantary Z (2011) A Fault Detection Method for Reversible Circuits. J Adv Math Comput Methods 1(1):15–20
5. Baumann R (2005) Soft Errors in Advanced Computer Systems. IEEE Des and Test of Computers 22(3):258–266
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