Author:
Oyeniran Adeboye Stephen,Ubar Raimund,Jenihhin Maksim,Raik Jaan
Cited by
2 articles.
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1. Environment for Innovative University Research Training in the Field of Digital Test;2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE);2021-09-01
2. On Test Generation for Microprocessors for Extended Class of Functional Faults;IFIP Advances in Information and Communication Technology;2020