Author:
Oyeniran Adeboye Stephen,Ubar Raimund,Jenihhin Maksim,Raik Jaan
Publisher
Springer International Publishing
Reference41 articles.
1. Gizopoulos, D., Paschalis, A., Zorian, Y.: Embedded Proecessor-Based Self-Test. Kluwer Academic Publisher, New York (2004)
2. Gizopoulos, D.: Advances in Electronic Testing. Springer, New York (2014).
https://doi.org/10.1007/0-387-29409-0
3. Chen, L., Dey, S.: Software-based self-testing methodology for processor cores. IEEE Trans. CAD IC Syst. 20(3), 369–380 (2001)
4. Kranitis, N., Gizopoulos, D., Xenoulis, G.: Software-based self-testing of embedded processors. IEEE Trans. Commun. 54(4), 369–380 (2005)
5. Gurumurthy, S., Vasudevan, S., Abraham, J.A.: Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor. ITC (2006)