Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications
Author:
Affiliation:
1. Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10321814/10321836/10321888.pdf?arnumber=10321888
Reference10 articles.
1. Design of Soft-Error-Aware SRAM With Multi-Node Upset Recovery for Aerospace Applications
2. Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application
3. GBRHQ-14T: Gate-Boosted Radiation Hardened Quadruple SRAM Design
4. A 1.2V, Radiation Hardened 14T SRAM Memory Cell for Aerospace Applications
5. Half-Select-Free Low-Power Dynamic Loop-Cutting Write Assist SRAM Cell for Space Applications
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