Just-Enough Stress Test for Infant-Mortality Screening Using Speed Binning
Author:
Affiliation:
1. National Tsing Hua University,Electrical Engineering Department,Taiwan
Funder
Ministry of Science and Technology
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983864.pdf?arnumber=9983864
Reference21 articles.
1. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
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4. In-Situ Characterization of High-Speed I/O Chip-Package Systems
5. Parameterized All-Digital PLL Architecture and its Compiler to Support Easy Process Migration
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1. Low-Jitter Frequency Doubling Circuit Supporting Higher-Speed BISG and Aging Sensing in a Chiplet-Based Design Environment;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024
2. Cell-Based Aging Sensor Using Built-In Speed Grading;2023 IEEE Nordic Circuits and Systems Conference (NorCAS);2023-10-31
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