Data extraction from SystemC designs using debug symbols and the SystemC API

Author:

Stoppe Jannis,Wille Robert,Drechsler Rolf

Publisher

IEEE

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. NISTT: A Non-Intrusive SystemC-TLM 2.0 Tracing Tool;2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC);2022-10-03

2. Automated Design Understanding of SystemC-Based Virtual Prototypes: Data Extraction, Analysis and Visualization;2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2020-07

3. Automated Nonintrusive Analysis of Electronic System Level Designs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-02

4. Integer Overflow Detection in Hardware Designs at the Specification Level;Proceedings of the 8th International Conference on Model-Driven Engineering and Software Development;2020

5. Automated Analysis of Virtual Prototypes at Electronic System Level;Proceedings of the 2019 on Great Lakes Symposium on VLSI;2019-05-13

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