Author:
Azimi Sarah,Sterpone Luca
Cited by
5 articles.
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1. Programmable SEL Test Monitoring System for Radiation Hardness Assurance;2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2023-06
2. Single-Event Latchup Vulnerability at the 7-nm FinFET Node;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
3. Radiation Effects on Digital Devices;Approximate Computing and its Impact on Accuracy, Reliability and Fault-Tolerance;2022
4. Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09
5. Digital Design Techniques for Dependable High Performance Computing;2020 IEEE International Test Conference (ITC);2020-11-01