Author:
Azimi Sarah,Sterpone Luca
Cited by
6 articles.
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1. Preliminary results of the Single Event Effect testing for the ULTRASAT sensors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-11
2. Programmable SEL Test Monitoring System for Radiation Hardness Assurance;2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2023-06
3. Single-Event Latchup Vulnerability at the 7-nm FinFET Node;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
4. Radiation Effects on Digital Devices;Approximate Computing and its Impact on Accuracy, Reliability and Fault-Tolerance;2022
5. Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09