Accurate on-chip interconnect evaluation: a time-domain technique
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx4/4/16453/00760372.pdf?arnumber=760372
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2. A process variation aware system-level framework to model on-chip communication system in support of fault tolerant analysis;2009 IEEE Student Conference on Research and Development (SCOReD);2009
3. An On-Chip Multichannel Waveform Monitor for Diagnosis of Systems-on-a-Chip Integration;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2007-10
4. Reducing Variation in Advanced Logic Technologies: Approaches to Process and Design for Manufacturability of Nanoscale CMOS;2007 IEEE International Electron Devices Meeting;2007
5. Programmable Reference Generator for On-Chip Measurement;2006 NORCHIP;2006-11
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