Author:
Benevit C.A.,Cassard J.M.,Dimmler K.J.,Dumbri A.C.,Mound M.G.,Prockyk F.J.,Rosenzweig W.,Yanof A.W.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. GPU-Based Redundancy Analysis Using Concurrent Evaluation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-03
2. EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-07
3. Introduction;System-on-Chip Test Architectures;2008
4. Memory Diagnosis and Built-In Self-Repair;VLSI Test Principles and Architectures;2006
5. Built-in redundancy analysis for memory yield improvement;IEEE Transactions on Reliability;2003-12