Introduction-Reference-Cited by-同舟云学术

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Introduction

Published:2008 Issue: Volume: Page:1-40
ISSN:
Container-title:System-on-Chip Test Architectures
language:
Short-container-title:

Author:

Wang Laung-Terng (L.-T.),Stroud Charles E.,Touba Nur A.

Publisher

Elsevier

Reference62 articles.

1. Digital Systems Testing and Testable Design;Abramovici,1994

2. Failure Mechanisms in Semiconductor Devices;Amerasekera,1987

3. Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits;Bushnell,2000

4. Embeddedsoftware-based self-testing forSoCdesign, in Chapter 28;Cheng,2006

5. Digital Systems Engineering;Dally,1998

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