Characterization of SiC Schottky diodes at different temperatures-Reference-Cited by-同舟云学术

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Characterization of SiC Schottky diodes at different temperatures

Published:2003-06 Issue:2 Volume:1 Page:54-57
ISSN:1540-7985
Container-title:IEEE Power Electronics Letters
language:
Short-container-title:IEEE Power Electron. Lett.

Author:

Ozpineci B.,Tolbert L.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology

Link

http://xplorestaging.ieee.org/ielx5/8012/27970/01249502.pdf?arnumber=1249502

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