A General Line–Line Method for Dielectric Material Characterization Using Conductors With the Same Cross-Sectional Geometry-Reference-Cited by-同舟云学术

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A General Line–Line Method for Dielectric Material Characterization Using Conductors With the Same Cross-Sectional Geometry

Published:2018-04 Issue:4 Volume:28 Page:356-358
ISSN:1531-1309
Container-title:IEEE Microwave and Wireless Components Letters
language:
Short-container-title:IEEE Microw. Wireless Compon. Lett.

Author:

Bao Xiue^ORCID,Liu Song^ORCID,Ocket Ilja^ORCID,Bao Juncheng,Schreurs Dominique,Zhang Shengkang,Cheng Chunyue,Feng Keming,Nauwelaers Bart^ORCID

Funder

KU Leuven C2 Project (μ² Bio) Project Funding

ARFTG student fellowship

MTT-S graduate fellowship

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics

Link

http://xplorestaging.ieee.org/ielx7/7260/8332645/08310028.pdf?arnumber=8310028

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3. An Accurate and Instantaneous Permittivity Measurement Using Modified Multi-line Method;2022 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT);2022-08-29

4. Determination of error-corrected full scattering parameters of a two-port device from uncalibrated measurements;Measurement;2022-02

5. Simple, Fast, and Accurate Broadband Complex Permittivity Characterization Algorithm: Methodology and Experimental Validation from 140 GHz up to 220 GHz;Electronics;2022-01-26

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