Microwave Surface Conductivity Measurement Using an Open-Ended Circular Waveguide Probe
Author:
Affiliation:
1. Iowa State University,Center for Nondestructive Evaluation (CNDE),Electrical and Computer Engineering Department (ECpE),Ames,IA,USA,50011
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9806445/9806446/09806657.pdf?arnumber=9806657
Reference15 articles.
1. Wideband Circular TE21and TE01Mode Converters With Same Exciting Topologies
2. Design and Test of Broadband Rectangular Waveguide TE10 to Circular Waveguide TE21 and TE01 Mode Converters
3. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
4. Dielectric properties of porous silicon for use as a substrate for the on-chip integration of millimeter-wave devices in the frequency range 140 to 210 GHz
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