Quantified system level threshold methodology
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Published:2017-10
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Container-title:2017 12th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
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Author:
Lai Dirack,Ho Mark
Cited by
1 articles.
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1. Quantified tabbed lines and ground void impact on real DDR5 eye margin;2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2022-10-26