Author:
Lai Dirack,Chen Arthur,Li Y L
Cited by
2 articles.
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1. Quantified tabbed lines and ground void impact on real DDR5 eye margin;2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2022-10-26
2. SysScale: Exploiting Multi-domain Dynamic Voltage and Frequency Scaling for Energy Efficient Mobile Processors;2020 ACM/IEEE 47th Annual International Symposium on Computer Architecture (ISCA);2020-05