Modeling correlation for solder joint fatigue life estimation in wafer-level chip scale packages
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7360833/7365161/07365195.pdf?arnumber=7365195
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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