Author:
Chang Yi-Ming,Wei Chia-Chen,Chen Jeffrey,Hsieh Pack
Cited by
11 articles.
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1. A Deep Learning-based General Defect Detection Framework for Automated Optical Inspection;2023 IEEE International Conference on Industry 4.0, Artificial Intelligence, and Communications Technology (IAICT);2023-07-13
2. Automatic Fault Detection in Soldering Process During Semiconductor Encapsulation;Informatics in Control, Automation and Robotics;2023
3. The Visual Inspection of Solder Balls in Semiconductor Encapsulation;Proceedings of the 19th International Conference on Informatics in Control, Automation and Robotics;2022
4. PCBNet: A Lightweight Convolutional Neural Network for Defect Inspection in Surface Mount Technology;IEEE Transactions on Instrumentation and Measurement;2022
5. SMT Component Defection Reassessment Based on Siamese Network;Communications in Computer and Information Science;2022