Oxygen-related Reliability of Amorphous InGaZnO Thin Film Transistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Oxygen-related Reliability of Amorphous InGaZnO Thin Film Transistors

Published:2020 Issue: Volume: Page:1-1
ISSN:2168-6734
Container-title:IEEE Journal of the Electron Devices Society
language:
Short-container-title:IEEE J. Electron Devices Soc.

Author:

Yen Chia-Chun,Tai An-Hung,Liu Yu-Chieh,Chen Tsang-Long,Chou Cheng-Hsu,Liu C. W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology

Link

http://xplorestaging.ieee.org/ielx7/6245494/6423298/09089236.pdf?arnumber=9089236

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhancements of electrical properties and positive bias instability in self-aligned top-gate a-IGZO TFTs by hydrogen incorporation;Semiconductor Science and Technology;2024-03-25

2. Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate;IEEE Transactions on Electron Devices;2023-09

3. Mobility Enhancement of BCE-Type Amorphous InGaZnO TFTs Using Triple-Layer Channels;IEEE Transactions on Electron Devices;2023-08

4. Electrical Performance and Reliability Enhancement of a-IGZO TFTs via Post-N₂O Plasma Optimization;IEEE Transactions on Electron Devices;2023-07

5. Multifunctional Crystalline InGaSnO Phototransistor Exhibiting Photosensing and Photosynaptic Behavior Using Oxygen Vacancy Engineering;Small Methods;2023-06-14

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP