No-Snapback LDMOS Using Adaptive RESURF and Hybrid Source for Ideal SOA
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology
Link
http://xplorestaging.ieee.org/ielx7/6245494/9359727/09552389.pdf?arnumber=9552389
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Ruggedness of Silicon Power MOSFETs—Part I: Cell Structure Design Related Failure: A Review;IEEE Transactions on Electron Devices;2024-06
2. Hybrid Source Laterally Diffused MOS Drain Engineering for ESD Robustness;IEEE Electron Device Letters;2023-12
3. 500 V breakdown voltage in β‐Ga2O3 laterally diffused metal‐oxide‐semiconductor field‐effect transistor with 108 MW/cm2 power figure of merit;IET Circuits, Devices & Systems;2023-05-03
4. 500 V Breakdown Voltage in β-Ga 2 O 3 LDMOSFET With 108 MW/cm 2 Power Figure of Merit;2022-09-01
5. Investigating the Correlation Between Space Charge Modulation and ON-State Breakdown in Multiple RESURF DeMOS Devices;IEEE Access;2022
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