A Cost-effective, Compact, Automatic Testing System for Dynamic Characterization of Power Semiconductor Devices-Reference-Cited by-同舟云学术

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A Cost-effective, Compact, Automatic Testing System for Dynamic Characterization of Power Semiconductor Devices

Published:2019-09 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE Energy Conversion Congress and Exposition (ECCE)
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Author:

Ghosh Avishek,Man Ho Carl Ngai,Prendergast Jared

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8897530/8911826/08912307.pdf?arnumber=8912307

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

2. Fully Modular, Dynamic SiC and GaN Testbench with Automated Temperature and Gate-Voltage Characterization;2023 IEEE Design Methodologies Conference (DMC);2023-09-24

3. Automated SiC MOSFET Power Module Switching Characterization Test Platform;2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia);2021-08-25

4. Design, Implementation, and Validation of Electro-Thermal Simulation for SiC MOSFETs in Power Electronic Systems;IEEE Transactions on Industry Applications;2021-05

5. A Simple Method to Validate Power Loss in Medium Voltage SiC MOSFETs and Schottky Diodes Operating in a Three-Phase Inverter;Energies;2020-09-12

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