Comparison of deadtime effects on the performance of DC-DC converters with GaN FETs and silicon MOSFETs

Author:

Glaser John S.,Reusch David

Publisher

IEEE

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Accurate Analytical eGaN® HEMT Parameterizable Matlab® Model Based on Datasheet from Manufacturer and Its Applications in Optimal Design;2023 IEEE Energy Conversion Congress and Exposition (ECCE);2023-10-29

2. Fast Switching of GaN Transistors using a Boosted Gate Voltage;2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe);2023-09-04

3. Enhanced Low-Voltage GaN FETs for e-Mobility Motor Control Improvements;2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE);2023-07-17

4. Dead Time Reduction Strategy for GaN-Based Low-Voltage Inverter in Motor Drive System;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19

5. TID Testing of COTS-based, Two-Phase, Point-of-Load Converters for Aerospace Applications;2023 IEEE Aerospace Conference;2023-03-04

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