1. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. An equivalent circuit model of HCI effect for short-channel N-MOSFET;Microelectronics Reliability;2022-09
3. An Equivalent Circuit of Hot Carrier Injection in Short-channel N-MOSFET;2021 6th International Conference on Integrated Circuits and Microsystems (ICICM);2021-10-22
4. A Fast Aging Simulation Based On Delta Model For Analog Circuit Modification and Verification;Proceedings of the 2019 2nd International Conference on Electronics, Communications and Control Engineering - ICECC 2019;2019
5. An Incremental Simulation Technique Based on Delta Model for Lifetime Yield Analysis;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2017