Compact model for vertical silicon nanowire based device simulation and circuit design
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7394793/7401627/07401675.pdf?arnumber=7401675
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Study on self-heating effect and lifetime in vertical-channel field effect transistor;Microelectronics Reliability;2021-04
2. Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing ${I}_{OFF}$ in Various Sub-10-nm 3-D Transistors;IEEE Transactions on Electron Devices;2019-01
3. Nanoarrays for Systolic Biosequence Analysis;Journal of Circuits, Systems and Computers;2018-06-22
4. Analysis of electrical characteristics and proposal of design guide for ultra-scaled nanoplate vertical FET and 6T-SRAM;Solid-State Electronics;2018-02
5. Performance and Variability Analysis of SiNW 6T-SRAM Cell Using Compact Model With Parasitics;IEEE Transactions on Nanotechnology;2017-11
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